Optical 3D Metrology (O3DM) is a series of conferences that build on the heritage of SPIE Videometrics (1991-2017) and Optical 3D Measurement Techniques (1989-2009).
The past editions of O3DM were held in Strasbourg (France) in December 2019 and in Wuerzburg (Germany) in December 2022 under the umbrella of ISPRS.
The primary theme of O3DM is the precise 3D measurement and accurate modellingfrom imaging and range sensors.
O3DMtopics of interest include:
-
sensor investigations and characterisation
-
radiometric and geometric calibration of sensors
-
sensor/data fusion
-
quality and calibration of colour for 3D models acquired by optical and range sensing techniques
-
algorithms for precise 3D data derivation and processing
-
ambiguous sequences in image orientation
-
hybrid adjustment
-
AI methods in metrology and industrial inspection
-
handling of transparent or reflective surfaces
O3DM is focussed on the growing interest in processing and modelling technology, and the increasing demand for accurate 3D models in applications such as industrial inspection, aerospace and automotive design, material and component testing, scene documentation, motion analysis, medicine and the exploration of remote and hazardous sites, just to name a few.
O3DM, like its predecessor events, wants to encourage the cooperation and information exchange between academia and industry in the field of optical metrology.
O3DM is an international workshop supported by the International Society of Photogrammetry, Remote Sensing and Spatial Information Sciences (ISPRS).
O3DM is organized as an ISPRS event and the third O3DM workshop will be held in Brescia, Italy, during 12-13 December 2024 at the University of Brescia. Brescia has excellent transport access by high speed trains and airports from Bergamo (30 min), Verona (30 min) or Milano (1h).
O3DM will be held in conjunction with the 8th international workshop "LowCost 3D". These are two complementary scientific events, accessible with the same registration fee, that will provide delegates with a wide range of topics centred on optical 3D measurement systems and applications. Participants could join both events with just one registration fee.
Giorgio Vassena, Universita' di Brescia
Mark Shortis, RMIT University, Australia
Fabio Remondino, Fondazione Bruno Kessler (FBK), Italy
