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26-29 giugno 2017 Munich (Germany) SPIE Optical Metrology Videometrics, Range Imaging and Applications XIV

Dear all, for three decades the Videometrics conferences have been providing a unique forum for vision metrology, photogrammetry, computer vision and image analysis researchers, developers and practitioners to present the latest advances in precise 3D measurement and accurate modeling from imaging and range sensors. The 14th edition of the Videometrics conference will focus on image and range data processing and modeling in applications such as rapid product development, monitoring, precision metrology, deformation analyses, 3D digitizing, material and component testing, human body modeling, surveillance, industrial inspections, cultural heritage applications and medicine.

Videometrics will be held within SPIE Optical Metrology (http://spie.org/conferences-and-exhibitions/optical-metrology), the premier conference in Europe that brings together users and researchers to discuss the latest inventions and applications in the field of optical metrology.   Optical Metrology is co-located with the Laser World of Photonics 2017, providing delegates with access to a huge exhibit of the latest technology associated with lasers and optical systems.

In 2017 Videometrics will feature two excellent invited speakers who will present the latest algorithms and techniques in metrology and robotics:

- Professor Ben Hughes, Principal Research Scientist, National Physical Laboratory, UK: Development of a high accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry.
- Dr Max Ruffo, CEO, Terabee, France: Optical and range sensors for robotics applications.

For Videometrics 2017, we invite submission of original research contributions, as well as demonstrations of successful applications in: 3D Sensing, Characterisation and Calibration; 3D Processing and Modeling; Motion Capture and Animation; and Visualization. 

Important Dates:
Abstract Due Date: 19 December 2016
Author Notification: 18 February 2017
Manuscripts Due: 15 April 2017

The Program Committee will accept both full papers for peer review and abstract submissions for professional papers (not peer reviewed).  Full papers must be no more than 8 pages in length and must adhere to the specified format for SPIE publications. Style templates are available here.

Abstracts should be a minimum of 500 and a maximum of 1000 words (approximately 1-2 pages of single-spaced 12 point font). Authors are encouraged to include figures and diagrams to illustrate the concepts outlined in the abstract.  See the Videometrics CfP for more information (http://spie.org/EOM17/conferencedetails/videometrics). 

Please circulate this announcement to all your colleagues and apologies in advance for any cross-posting of the announcement.

Looking forward to meeting you in Munich!

On behalf of the Videometrics conference committee,
Fabio Remondino and Mark Shortis 


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